Reliability & Mean Time Between Failures (MTBF)
 

Thermoelectric devices are highly reliable due to their solid state construction. Although reliability is somewhat application dependent, MTBFs calculated as a result of tests performed by various customers are on the order of 200,000 to 300,000 hours at room temperature. Elevated temperature (80°C) MTBFs are conservatively reported to be on the order of 100,000 hours. Field experience by hundreds of customers representing more than 7,500,000 of our CP type modules and more than 800,000 OptoTEC™ type modules during the last ten years have resulted in a failure return of less than 0.1%. More than 90% of all modules returned were found to be failures resulting from mechanical abuse or overheating on the part of the customer. Thus, less than one failure per 10,000 modules used in systems could be suspect of product defect. Therefore, the combination of proper handling, and proper assembly techniques will yield an extremely reliable system.

Historical failure analysis has generally shown the cause of failure as one of two types:

Mechanical damage as a result of improper handling or system assembly techniques.


Moisture:

Moisture must not penetrate into the thermoelectric module area. The presence of moisture will cause an electro-corrosion that will degrade the thermoelectric material, conductors and solders. Moisture can also provide an electrical path to ground causing an electrical short or hot side to cold side thermal short. A proper sealing method or dry atmosphere can eliminate these problems.

Shock and Vibration:

Thermoelectric modules in various types of assemblies have for years been used in different Military/Aerospace applications. Thermoelectric devices have been successfully subjected to shock and vibration requirements for aircraft, ordinance, space vehicles, shipboard use and most other such systems. While a thermoelectric device is quite strong in both tension and compression, it tends to be relatively weak in shear. When in a severe shock or vibration environment, care should be taken in the design of the assembly to ensure "compressive loading" of thermoelectric devices.

Mechanical Mounting:

A common failure mode for thermoelectric modules is un-even compression forces induced by improper torqing, bolting patterns, and mechanical conditions of heat exchangers. The polycrystalline thermoelectric material exhibits less strength perpendicular to the length (growth axis) than the horizontal axis. Thus, the thermoelectric elements are quite strong in compressive strength and tend to be weak in the shear direction. During assembly, un-even torquing or un-flat heat exchangers can cause severe shear forces. Recommended compression value is 150 PSI. (See assembly instructions for proper mounting techniques.)

Inadvertent overheating of the module.

The direct soldering process does result in temperature restriction for operation or storage of the modules.
At temperatures above 80°C two phenomena seriously reduce useful life:

Above 80°C copper diffusion into the thermoelements occurs due to increasing solid solubility in the thermoelectric material and increasing diffusion rate. At 100 - 110°C the combined solubility and diffusion rate could result in approximately 25% loss of device performance within 100 hours.

Above 85°C in the soldering process (using Bismuth-Tin Alloy) small amounts of selenium, tellurium, antimony and nickel are inherently dissolved into the bismuth-tin solder. Although the melting point of the base solder is 136°C, the combined mixture of all elements results in either a minute eutectic phase or a highly effective solid state reaction occurring at above 85°C that starts to delaminate the ends of the thermoelements by physical penetration between cleavage planes in the thermoelectric material. This results in a mechanical failure of the interface.